Nanotechnology Now – Press Release: O-FIB: Far-field-induced near-field breakdown for direct nanowriting in an atmospheric environment

Home > Press > O-FIB: Far-field-induced near-field breakdown for direct nanowriting in an atmospheric environmenta, Schematic plot of the evanescent wave (Eew) around two nanoholes with different sizes on a dielectric. For the larger nanohole with a diameter comparable to the wavelength, the evanescent fields at each edge of the...